| The Bivalent Defect of Modular Codes. The Choise of Technological Modules, that Reduce Bivalent Defect |
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| Authors |
| | Amerbaev V.M. |
| | Telpukhov D.V. |
| | Konstantinov A.V. |
| Date of publication |
| | 2008 |
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| Abstract |
| | The actual problem of adaptation of perspective nonconventional multiple-valued parallel structure arithmetics to two-valued electronic components of modern design technologies is studied. The concept of modular codes bivalent defect is introduced. Bivalent defect allows to carry out a flexible choice of technological modules depending on the technological purposes. |
| Keywords |
| | bivalent defect, technological modules, modular codes, Residue Number System. |
| Library reference |
| | Amerbaev V.M., Telpukhov D.V., Konstantinov A.V. The Bivalent Defect of Modular Codes. The Choise of Technological Modules, that Reduce Bivalent Defect // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 462-465. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2008/87.pdf |
