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Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons
Authors
	Stenin V.Ya.
	Betelin V.B.
	Bobkov S.G.
	Krasnyuk A.A.
	Osipenko P.N.
	Cherkasov I.G.
	Chumakov A.I.
	Yanenko A.V.
Date of publication
	2008
Abstract
	Main effects of impact of atmospheric neutrons on VLSI are single failures and thyristor effects which elimination is a subject of designing both failure-proof VLSI and equipments.
Keywords
	failure-proof equipment, impact of atmospheric neutrons, VLSI
Library reference
	Stenin V.Ya., Betelin V.B., Bobkov S.G., Krasnyuk A.A., Osipenko P.N., Cherkasov I.G., Chumakov A.I., Yanenko A.V. Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 256-259.
URL of paper
	http://www.mes-conference.ru/data/year2008/46.pdf