Research of influence of constructive-technology factors on sensitivity of magnetic transistor with methods of device-technological simulation |
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Authors |
| Kozlov A.V. |
| Tikhonov R.D. |
| Parmenov Yu.A. |
Date of publication |
| 2008 |
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Abstract |
| By means of system of device-technological simulation ISE TCAD it is carried out research of influence of structurally-technology factors and an operating mode of two-collector bipolar magnetic transistor on its relative current sensitivity. |
Keywords |
| magnetic transistor, device-technological simulation |
Library reference |
| Kozlov A.V., Tikhonov R.D., Parmenov Yu.A. Research of influence of constructive-technology factors on sensitivity of magnetic transistor with methods of device-technological simulation // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 183-188. |
URL of paper |
| http://www.mes-conference.ru/data/year2008/31.pdf |