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DFM Improvement of Hierarchical Layouts

Authors
 Mukhanov K.S.
 Sotnikov M.A.
Date of publication
 2008

Abstract
 The automatic correction of hierarchical layouts is a real issue in terms of yield enhancement. This paper describes an algorithm that rests on algorithms of DFM improvement developed for standard cells. The effectiveness of the described algorithm is proofed by experiments.
Keywords
 yield, hierarchical layout, DFM
Library reference
 Mukhanov K.S., Sotnikov M.A. DFM Improvement of Hierarchical Layouts // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 140-145.
URL of paper
 http://www.mes-conference.ru/data/year2008/22.pdf

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