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Accelerated characterization technique for multi-bit flip-flops with accuracy control
Authors
	Ilin S.A.
	Lastochkin O.V.
	Ishchenko N.A.
Date of publication
	2022
DOI
	10.31114/2078-7707-2022-3-53-57
Abstract
	Power consumption reducing is one of the most important challenges for modern System-on-a-Chip (SoC). There are various ways to solve this problem. One of the ways to reduce both the power consumption and the area occupied is the use of multi-bit cells. Longest stages of standard cell libraries design flow is characterization. Article discusses a method for controlling the accuracy of multi-bit triggers characterization. A method allows you to control the time depending on the accuracy. The reference model contains the most complete enumeration of power measurement conditions. To verify this, a correlation check of the results of power analysis using Synopsys Prime. When analyzing the measurement tasks, it was found that the switching power included in the dynamic power depends on the control inputs, such as clock signal, reset and set signals. Thus, the main place for optimizing the conditions for calculating the total power is the internal power. By various variations of the conditions for measuring the internal power, an optimal set of conditions for measuring the internal power was selected, which made it possible to reduce the number of simulations and, accordingly, the time of characterization. In order to make sure that the model is suitable for commercial development, a re-correlation test of the power analysis results from the Liberty against SPICE was carried out. This article discusses a technique for accelerated characterization of multi-bit flip-flops with accuracy control, formulates optimization criteria for the characterization process, and presents the results. The proposed technique makes it possible to reduce the time for characterizing the dynamic power of a multi-bit trigger by 12% while maintaining acceptable accuracy.
Keywords
	multi-bit trigger, frequency, time constraints, digital library, standard cell library, design route, nanometer technology, VLSI
Library reference
	Ilin S.A., Lastochkin O.V., Ishchenko N.A. Accelerated characterization technique for multi-bit flip-flops with accuracy control // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2022. Issue 3. P. 53-57. doi:10.31114/2078-7707-2022-3-53-57
URL of paper
	http://www.mes-conference.ru/data/year2022/pdf/D049.pdf