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Atomic force microscopy of amorphous electrotechnical alloys Fe(Ni,Cu)(SiB)
Authors
	Kaminskaya T.P.
	Shipko M.N.
	Stepovich M.A.
	Popov V.V.
	Tikhonov A.I.
Date of publication
	2022
DOI
	10.31114/2078-7707-2022-3-206-211
Abstract
	In the electrotechnical industry, amorphous Fe(Ni, Cu)(SiB) alloys are widely used for the manufacture of digital transformer cores. One of the reasons hindering their wider application is the relatively high magnetization reversal losses determined by the state of the surface of the amorphous ribbon and the geometry of the domain struc-ture. In this work, the surface of samples of amorphous electrical steel (foil) Fe(Ni, Cu)(SiB) with a thickness of about 100 μm, a width of 10 mm, and a length of 50 mm, which was obtained by ultrafast cooling by melt spraying on a rotating drum. As a result of ultrafast cooling on a rotating copper drum, the electromagnetic properties of such materials are largely determined by the state of the surface, the features of the surface migration of atoms, the appearance of local areas of the surface with a changed degree of positional order in the arrangement of atoms. Such areas are inhomogeneities in the distribution of electric fields, characterized by high values of their gradients, which provide a change in the energy state of the charges and, as a consequence, a change in the micro- and macroscopic properties of the alloys. To study the features of the states of inhomogeneities and the possibilities of modifying electrical materials, the study of the surface of such materials is of particular importance. Atomic force microscopy is the most suitable method for studying such objects, since it does not require the deposition of a conductive coating on the surface and the creation of a high vacuum. In this work, studies were carried out on the contact surface adjacent to the copper drum, as well as on the second, free surface. A detailed description of the characteris-tic features of the structure of both surfaces of the foil is given. Characteristic structural elements were found on the contact surface of the foil, the presence of which in various places on the surface can significantly affect the electrical properties of the material.
Keywords
	amorphous electrotechnical alloys, atomic force microscopy, surface structure.
Library reference
	Kaminskaya T.P., Shipko M.N., Stepovich M.A., Popov V.V., Tikhonov A.I. Atomic force microscopy of amorphous electrotechnical alloys Fe(Ni,Cu)(SiB) // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2022. Issue 3. P. 206-211. doi:10.31114/2078-7707-2022-3-206-211
URL of paper
	http://www.mes-conference.ru/data/year2022/pdf/D047.pdf