| SATOK - System for Self-Timed Integrated Circuits Testing |
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| Authors |
| | Petrukhin V.S. |
| | Stepchenkov Yu.A. |
| | Morozov N.V. |
| | Stepchenkov D.Yu. |
| Date of publication |
| | 2006 |
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| Abstract |
| | The main problems of coupling controlling and measuring apparatus with self-timed circuits are considered. The structure of hardware-software testing system SATOK is presented. This system is used for comparative testing of synchronous and self-timed implementations of the functionally identical circuits. Detailed description of user interface for such testing is presented also. |
| Keywords |
| | Self-timed circuits; testing; tester |
| Library reference |
| | Petrukhin V.S., Stepchenkov Yu.A., Morozov N.V., Stepchenkov D.Yu. SATOK - System for Self-Timed Integrated Circuits Testing // Problems of Perspective Microelectronic Systems Development - 2006. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2006. P. 265-268. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2006/47.pdf |
