| The Concurrent Error-Detection Circuit Typical Structure Based on Boolean Correction and Calculations Control by Two Diagnostic Parameters in the Experiment |
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| Authors |
| | Efanov D.V. |
| | Pivovarov D.V. |
| Date of publication |
| | 2022 |
| DOI |
| | 10.31114/2078-7707-2022-1-50-58 |
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| Abstract |
| | A description of the circuitʼs organization typical structure for concurrent error-detection circuit (CED) for automation and computer technology devices is given. The structure is implemented using Boolean correction and assumes the calculations control organization by five outputs groups in each. Signals from the five outputs are compressed using a special four-signal compression circuit. The compression circuit is a weight-transition sum code encoder with weights from a number 2 increasing powers series. The code using guarantees any combination of distortions detection at the inputs, except for the simultaneous distortion of all five signals. Boolean correction is carried out in the signal correction block using four two-input XOR elements. Four control functions are used for correction. These functions are formed in the check logic block. They are chosen so that at the outputs of the signal correction block, code words are formed from the two-rail checker (TRC) working combinations set or from the 2-out-of-4 constant-weight code working combinations set. Each function of code word bits must belong to the self-dual class. This way of organizing the CED allows controlling the calculations by two diagnostic parameters. The experiment shows the applying effectiveness the approach for combinational devices CED organizing circuits. |
| Keywords |
| | concurrent error-detection circuit (CED circuit); function self-duality control; functions belonging control to two-rail checker working combinations; signal compression circuit by weight-based sum code; error detection in calculations. |
| Library reference |
| | Efanov D.V., Pivovarov D.V. The Concurrent Error-Detection Circuit Typical Structure Based on Boolean Correction and Calculations Control by Two Diagnostic Parameters in the Experiment // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2022. Issue 1. P. 50-58. doi:10.31114/2078-7707-2022-1-50-58 |
| URL of paper |
| | http://www.mes-conference.ru/data/year2022/pdf/D006.pdf |
