| A Fast Method of Generating Pseudo-Random Vectors of High Dimension for testing Systems-on-Chip |
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| Authors |
| | Dyabin M.I. |
| | Reshetnikov A.V. |
| | Saksonov E.A. |
| Date of publication |
| | 2021 |
| DOI |
| | 10.31114/2078-7707-2021-4-86-91 |
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| Abstract |
| | This paper offers a new algorithm for generating pseudo-random vectors in case when they are not required to be distributed uniformly. It uses an internal variable and the components of an input vector in order to build an output vector, but a feature of the generator is it not based on an auxiliary pseudo-random number generator. A testing pro-cedure is described, which shows some of the method's ad-vantages before the trivial method of filling the components of output vector by subsequent elements of a sequence of pseudo-random numbers.
While testing microprocessors sometimes it is necessary to fill a buffer in memory with values generated in a pseu-dorandom way. Formally, such task can be reduced to the task of building a pseudorandom vector. But the quality of the generated pseudo-random vector sequence is not mean-ingful in this case: instead, the speed of the generator and the ease of its implementation may be important. Such is the method described in this article. |
| Keywords |
| | pseudorandom vector generator, functional testing of mi-croprocessor. |
| Library reference |
| | Dyabin M.I., Reshetnikov A.V., Saksonov E.A. A Fast Method of Generating Pseudo-Random Vectors of High Dimension for testing Systems-on-Chip // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2021. Issue 4. P. 86-91. doi:10.31114/2078-7707-2021-4-86-91 |
| URL of paper |
| | http://www.mes-conference.ru/data/year2021/pdf/D085.pdf |
