| Investigation of CMOS Multiplexor SEL Sensitivity at Low Temperature |
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| Authors |
| | Mozhaev R.K. |
| | Lukashin V.P. |
| | Ukolov D.S. |
| | Pechenkin A.A. |
| Date of publication |
| | 2020 |
| DOI |
| | 10.31114/2078-7707-2020-4-212-216 |
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| Abstract |
| | The paper presents the data obtained during the study of CMOS multiplexors single-event effects sensitivity at ion accelerator and at laser SEE-simulation facility. A comparison of SEL rate at normal and low temperature is made. |
| Keywords |
| | Single Event Effects, CMOS Multiplexor, laser SEE simulation technique, temperature dependence. |
| Library reference |
| | Mozhaev R.K., Lukashin V.P., Ukolov D.S., Pechenkin A.A. Investigation of CMOS Multiplexor SEL Sensitivity at Low Temperature // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2020. Issue 4. P. 212-216. doi:10.31114/2078-7707-2020-4-212-216 |
| URL of paper |
| | http://www.mes-conference.ru/data/year2020/pdf/D118.pdf |
